Show

Show器

10.1 inch (diagonal) capacitive touch screen

The proportion of

16:9

Resolution

1280×RGB×800

Test frequency

The scope of

20Hz-500kHz

20Hz-2MHz

20Hz-500kHz

Precision

0.01%

Resolution

0.1mHz (20.0000Hz-99.9999Hz)

1mHz (100.000Hz-999.999Hz)

10mHz (1.00000kHz-9.99999kHz)

100mHz (10.0000kHz-99.9999kHz)

1Hz (100.000kHz-999.999kHz )

10Hz (1.00000MHz-2.00000MHz)

AC test signal mode

Rating (ALCOFF)

Set the voltage as Hcur voltage -- when the test end is open

Set the current as the outgoing current from Hcur when the test terminal is short-circuited

Constant value

(ALCON)

Keep the voltage on the DUT the same as the set value

Keep the current on the DUT the same as the set value

Test level

电压The scope of

5mVrms-20Vrms

F≤1MHz 5mVrms-20Vrms

F>1MHz 5mVrms-15Vrms

5mVrms-20Vrms

Accuracy

± (10percent x set value 2mV) (AC≤2Vrms)

± (10percent x Set value 5mV) (AC > 2Vrms)

Resolution

1mVrms(5mVrms-0.2Vrms)

1mVrms(0.2Vrms-0.5Vrms)

1mVrms(0.5Vrms-1Vrms)

10mVrms(1Vrms-2Vrms)

10mVrms(2Vrms-5Vrms)

10mVrms(5Vrms-10Vrms)

10mVrms(10Vrms-20Vrms)

电流The scope of

50μArms-100mArms

Resolution(100Ω 内阻)

10μArms(50μArms-2mArms)

10μArms(2mArms-5mArms)

10μArms(5mArms-10mArms)

100μArms (10mArms-20mArms)

100μArms (20mArms-50mArms)

100μArms (50mArms-100mArms)

R DC Test

电压The scope of

100mV-20V

Resolution

1mV(0V-1V)

10mV(1V-20V)

电流The scope of

0mA-100mA

Resolution

10μA(0mA-10mA)

100μA(10mA-100mA)

DC offset

电压The scope of

0V-±40V

Accuracy

AC≤2V 1percent× set voltage 5mV

AC>2V 2percent× set voltage 8mV

Resolution

1mV(0V - ±1V)

10mV(±1V - ±40V)

电流The scope of

0mA-±100mA

Resolution

10μA（0mA-10mA）

100μA（10mA-100mA）

Built-in current source

电流The scope of

0mA-2A

Accuracy

I>5mA ±（2%×设定值+2mA）

Resolution

1mA

Output impedance

30Ω,±4 @1kHz

100Ω,±2 @1kHz

LCR module measurement parameters

Measurement parameters

The way

Any choice of four parameters

AC

Cp/Cs、Lp/Ls、Rp/Rs、|Z|、|Y|、R、X、G、B、θ、D、Q、V AC 、I AC

DC

R DC 、V DC 、I DC

Test端配置

The four-end pairs of

Test电缆长度

0m、1m、2m、4m

Mathematical operation

The absolute deviation from the nominal value is δand the percentage deviation from the nominal value is Δpercent

等效The way

Series, parallel

Calibration function

开路OPEN、短路SHORT、负载LOAD

Measure the average

1-255 times

Range selection

自动AUTO、手动HOLD

Range configuration

LCR

100mΩ、1Ω、10Ω、20Ω、50Ω、100Ω、200Ω、500Ω、1kΩ、2kΩ、5kΩ、10kΩ、20kΩ、50kΩ、100kΩ

R DC

1Ω、10Ω、20Ω、50Ω、100Ω、200Ω、500Ω、1kΩ、2kΩ、5kΩ、10kΩ、20kΩ、50kΩ、100kΩ

Measurement time (ms)

Fast: 0.56ms

Fast: 3.3ms

Medium speed ： 90ms

Slow speed: 220ms

Accuracy

0.05percent (specific reference instruction manual)

测量ShowThe scope of

Cs、Cp

0.00001pF-9.99999F

Ls、Lp

0.00001μH-99.9999kH

D

0.00001-9.99999

Q

0.00001-99999.9

R、Rs、Rp、X、Z、R DC

0.001mΩ-99.9999MΩ

G、B、Y

0.00001μs-99.9999S

V DC

±0V-±999.999V

I DC

±0A-±999.999A

θ r

-3.14159-3.14159

θ d

-179.999°-179.999°

Δ%

±（0.000%-999.9%）

TurnsRatio

1：0.001—1000：1

LCR模块其他Test参数请参考TH2840系列LCR数字电桥Technical parameters部分

Transformer measurement

Test参数

Cs/Cp: capacitance, Ls/Lp: inductance,DCR: DC resistance,Zx: impedance,Rs/Rp: resistance,D: loss,Q: quality factor,dZ: Phase Angle,Lk: leakage,Phase: phase),Balance: balance

Turns-Ratio（圈数比 ) :Ns :Np=U2/U1,Np:Ns=U1/U2 Turns (winding number) :Ns= Np×U2/U1,Np=Ns×U1/U2

TestMode

Continuous

在单次触发The way下,手动触发一次,测完设置的变压器有Test参数一次

Single step

在单次触发The way下,手动触发一次,测量变压器的一个Measurement parameters,再触发一次,再测下一个参数

Measurement time (ms)

Fast

Fast: 3.3ms, Fast+：1ms(＞10kHz)

Medium speed

Medium speed：90ms

Slow speed

Slow speed: 220ms

Offset source

Reference bias partial parameters

The average number of times

每个Test参数可以设置不同的The average number of times,The average number of times为0-255

Delay time

每个Test参数可以设置不同的Delay time时间,

Transformer scanning

Built-in scan path (PIN)

6 x (24 x 2) =288PIN (AX,BX without built-in scan board)

Transformer HANDLE interface

Pin definition

NS1-NS30,GOOD,NG,TEST, Trigger, reset (consistent with TH2829X series) (NX) (AX,BX NSI-NS9)

Output characteristics

Photocoupling isolation,ULN2003 drive enhancement, collector output

Mode

Direct reading, percentage

The range of

Automatic, keep

Offset source

Reference bias partial parameters

External scanning box

Compatible with TH1901 series,TH1831 scan box

Number of windings

Primary

60

Secondary

9

The average number of times

每个Test参数可以设置不同的The average number of times,The average number of times为0-255

Delay time

每个Test参数可以设置不同的Delay time时间

Measurement time (ms)

Fast

Fast: 3.3ms(≥1kHz), Fast+：1ms(≥10kHz) (不含继电器动作时间)

Medium speed

Medium speed：90ms

Slow speed

Slow speed: 220ms

Test引线Interface

25*2pinFRC socket, pin order is exactly the same as TH2829 series (NX)

Other functions and parameters

Store call

Inside

约100M非易失存储器Test设定文件

External USB

Test设定文件、截屏图形、记录文件

Keyboard lock

Lockable front panel key

Interface

USB HOST

2个USB HOSTInterface,可同时接鼠标、键盘,U盘同时只能使用一个

USB DEVICE

Universal serial bus socket, small Class B (4 contact positions); Consistent with the USBTMC-USB488 and USB2.0, the female connector is used to connect the external controller

LAN

10/100BaseT Ethernet,8 pins, Speed adaptive

HANDLER

For Bin classification signal output

External DC BIAS

Control

支持TH1778A(Transformer scanning不支持)

RS232C

Standard 9 pins, cross

RS485

Can receive reform or external RS232 to RS485 module

Boot preheating time

60 minutes

Input voltage

100-120VAC/198-242VAC optional,47-63Hz

Power consumption

Not less than 130VA

尺寸（WxHxD）mm 3

430mm(W)x177mm(H)x265mm(D)

430mm(W)x177mm(H)x405mm(D)

Weight (kg)

11kg

17kg